was used to collect ED data. In thismethod the
electron microscope is controlled by dedicated software only.
The electron beam is rotated along a circle at a certain angle
(so-called precession angle; 2° in this work) around the
optical axis of the microscope. The beam rotation along the
circle is sampled with a fixed azimuthal step (3° in this work)
which results in 120 individually beam-tilted ED patterns.