This paper is organized as follows: In Section II,
feasibility of on-line power device temperature extraction
methods is overviewed. Then, a new P-i-N diode chip
temperature extraction method is proposed in Section III. In
Section IV, the principle of reverse recovery current of the
power diodes with non-ideal IGBT commutation is
investigated, and the experimental results are illustrated to
demonstrate the proposed method in Section V. At last,
Section VI summarizes the conclusions drawn from the
above investigation.