Graphene oxide (GO) films with two-dimensional structure were successfully prepared via the modified Hummer method. It is
proven that redox method is a promising way to synthesize GO films on a large scale. Comprehensive characterizations of the
properties of GO films were conducted.TEM and DFM analyses showed that GO sheets prepared in this study had single and double
lamellar layer structure and a thickness of 2∼3 nm. X-ray diffraction (XRD) was selected to measure the crystal structure of GO
sheet. Fourier-transforminfrared spectra analyzer (FT-IR) was used to certify the presence of oxygen-containing functional groups
in GO films. The tests of UV-VIS spectrometer and TGA analyzer indicated that GO sheet possessed excellent optical response
and outstanding thermal stability. Elemental analyzer (EA) and X-ray photoelectron spectroscope (XPS) analyzed the components
syntheticmaterial. Simultaneously, chemical structure ofGOsheet was described in this study. Discussion and references for further
research on graphene are provided.