X-Ray Fluorescence spectrometers (XRF) use high energy X-rays (or gamma rays) to excite fluorescent radiation or photons from a sample for elemental analysis. In wavelength dispersive x-ray fluorescence spectroscopy (WDXRF), photons emitted by the sample are separated or dispersed by diffraction before hitting the detector. This is accomplished by placing an analyzing crystal between the sample and the detector. Therefore, WDXRF spectrometers have better resolution than energy dispersive x-ray fluorescence spectrometers which do not contain an analyzing crystal. However, due to the increase in optical components, WDXRF spectrometers typical have a lower efficiency than EDXRF spectrometers and, hence, require a higher power x-ray tube (which can add to the cost of the instrument).