This design is implemented in two versions in a testchip
fabricated on a 65 nm CMOS technology. The first one is
fully mapped (i.e gate and flip-flops) on standard unhardened
cells while the second one is implemented with hardenedby-
design flip-flops and clock tree cells [6]. It is important
to note that hardened-by-design combinational cells were not
used for any implementation due to their area overhead. Both
devices are SECDED-ECC protected and strictly exhibit the
same architecture.