Materials with semiconductor quantum dots are attractive as possible components for use in various devices of nonlinear optics and optoelectronics. At the end of the 20th century, it had been shown that zeolites and zeolite-like materials can be used for producing a wide variety of low-dimensional semiconductor systems inside regularly arranged pores. In particular, considerable advances had been made in the field of the encapsulation of chalcogenide clusters into zeolites of
different structure types, as well as in the monitoring of the encapsulated atoms with the use of ultraviolet spectroscopy and high-resolution electron microscopy. The zeolite framework limits the size of encapsulated clusters and provides a regular order of their arrangement, which makes it possible to investigate their structure by the methods of X-ray diffraction analysis. Up to now, there have appeared a relatively small number of papers devoted to the single-crystal X-ray diffraction investigation of chalcogenide clusters encapsulated into the zeolite matrix