SCAN – MODE CONTROLS ..............

SCAN – MODE CONTROLS ................................................................................................................................... 29
SCAN – TOL (TOLERANCE) CONTROLS ............................................................................................................... 29
SCAN – PACKAGE CONTROLS (TRACKER 2800S) ............................................................................................. 30
CONTROL – SWITCH CONTROLS ....................................................................................................................... 31
CONTROL – DIAGS CONTROLS .......................................................................................................................... 32
CONTROL – 2000 MODE ..................................................................................................................................... 34
SECTION 3 TESTING PASSIVE COMPONENTS .................................................................................... 35

3-1. RESISTORS .............................................................................................................................................. 35
3-2. CAPACITORS .......................................................................................................................................... 40
3-3. INDUCTORS ............................................................................................................................................. 47
3-4. ELECTROMECHANICAL SWITCHING COMPONENTS ............................................................... 52
SECTION 4 TESTING DISCRETE SEMICONDUCTORS ....................................................................... 55

4-1. DIODES ..................................................................................................................................................... 55

ผลลัพธ์ (ไทย) 1:

SCAN – MODE CONTROLS ................................................................................................................................... 29SCAN – TOL (TOLERANCE) CONTROLS ............................................................................................................... 29การสแกน – ชุดควบคุม (TRACKER 2800S) ... 30CONTROL – SWITCH CONTROLS ....................................................................................................................... 31CONTROL – DIAGS CONTROLS .......................................................................................................................... 32CONTROL – 2000 MODE ..................................................................................................................................... 34ส่วน 3 การทดสอบส่วนประกอบแฝง... 35 3-1. RESISTORS .............................................................................................................................................. 353-2. CAPACITORS .......................................................................................................................................... 403-3. INDUCTORS ............................................................................................................................................. 473-4. ส่วนประกอบสลับไฟฟ้า... 52ส่วน 4 การทดสอบแยกกันอิเล็กทรอนิกส์เรีย... 55 4-1. DIODES ..................................................................................................................................................... 55

ผลลัพธ์ (ไทย) 2:

SCAN - ควบคุมโหมด 29
SCAN - TOL (ความอดทน) อุปกรณ์ 29
SCAN - การควบคุมการแพคเกจ (TRACKER 2800S) ......................................... .................................................. .. 30
การควบคุม - การควบคุมสวิตช์ 31
การควบคุม - การควบคุมการ Diags 32
CONTROL - 2000 โหมด 34
ตอนที่ 3 การทดสอบส่วนประกอบแบบ Passive ............................................ ........................................ 35 3-1 RESISTORS 35 3-2 ตัวเก็บประจุ 40 3-3 INDUCTORS 47 3-4 Electromechanical Components SWITCHING ............................................... ................ 52 ตอนที่ 4 การทดสอบอุปกรณ์กึ่งตัวนำ ............................ ........................................... 55 4-1 DIODES 55

ผลลัพธ์ (ไทย) 3:

โหมดการสแกน–การควบคุม ................................................................................................................................... 29
สแกน–ต้อล ( ความอดทน ) การควบคุม ............................................................................................................... 29
สแกน–แพคเกจการควบคุม ( ติดตาม 2800s ) ............................................................................................. 30
ควบคุมสลับการควบคุม ....................................................................................................................... จำกัด
31 – diags การควบคุม .......................................................................................................................... ควบคุม 32
–ควบคุมโหมด ................................ 2000..................................................................................................... การทดสอบส่วนประกอบเรื่อยๆ .................................................................................... 34
มาตรา 3 35

3-1 ตัวต้านทาน .............................................................................................................................................. 35
3-2 .ตัวเก็บประจุ .......................................................................................................................................... 40
3-3 . ............................................................................................................................................. inductors 47
3-4 . ไฟฟ้าสลับชิ้นส่วน ............................................................... การทดสอบเซมิคอนดักเตอร์ ....................................................................... มาตรา 52
4 แบบไม่ต่อเนื่อง 55

4-1 ..................................................................................................................................................... ไดโอด 55