The degree of diffracted X-rays depends on arranging the materail's atome planes whitin the crystal lattice. The law recounts diffraction angle and
lattice atomic planes spacing at specific wavelength
of electromagnetic radiation. A detector is used to
detect diffracted X-rays followed by processing and
counting of the diffracted rays to give rise diffracted
or pattern beams (Fig. 1). Changeover of diffracted
patterns into d-spacings allows recognition of the
unknown sample. Typicallymaterials are identified
by comparing the diffracted pattern beams with
many reference patterns stored in the JCPDS library.
The details procedure andmechanismof XRD
method could be obtained fromXRD textbooks