WCT instruments showcase our unique measurement and analysis techniques, including the SEMI Standard Quasi-Steady-State Photocon- ductance (QSSPC) lifetime measurement method developed by Sinton Instruments in 1994. The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low-lifetime samples. This method complements the use of the transient photoconductance tech- nique that is also standard on this instrument.
The QSSPC lifetime measurement also yields the implied open-circuit voltage (versus illumina- tion) curve, which is comparable to an I-V curve at each stage of a solar cell process.