Results show that span time for the integrated simulationexperimental
part development cycle can be reduced by
approximately 60%, while the actual man-hours can be
reduced by approximately 30%. The reason for the long span times in the sequential process is the repetitive cycle of set-up,
part production and analysis until an acceptable part is created.
It is a trial and error process, which is time-consuming
and produces a lot of material scrap. On the other hand, the
concurrent process optimises parameters virtually, and therefore,
eliminates scrap, machine downtime and the need for
experimental optimisation.
Results show that span time for the integrated simulationexperimental
part development cycle can be reduced by
approximately 60%, while the actual man-hours can be
reduced by approximately 30%. The reason for the long span times in the sequential process is the repetitive cycle of set-up,
part production and analysis until an acceptable part is created.
It is a trial and error process, which is time-consuming
and produces a lot of material scrap. On the other hand, the
concurrent process optimises parameters virtually, and therefore,
eliminates scrap, machine downtime and the need for
experimental optimisation.
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