The WDXRF analyzer uses a x-ray source to excite a sample. X-rays that have wavelengths that are
characteristic to the elements within the sample are emitted and they along with scattered source x-rays
go in all directions. A crystal or other diffraction device is placed in the way of the x-rays coming off the
sample. A x-ray detector is position where it can detector the x-rays that are diffracted and scattered off
the crystal. Depending on the spacing between the atoms of the crystal lattice (diffractive device) and its
angle in relation to the sample and detector, specific wavelengths directed at the detector can be
controlled. The angle can be changed in order to measure elements sequentially, or multiple crystals and
detectors may be arrayed around a sample for simultaneous analysis.