which
was recorded over the 2h from 10 to 80 by step scanning at
5 min1 with Cu Ka radiation (k = 1.540562 Å) under 40 kV and
40 mA. The morphologies and microstructures of the catalyst
particles were evaluated by SEM images (HITACHI, S-3400N II)
with an accelerating voltage of 20 kV and TEM (JEOL, JEM-200CX)
with an accelerating voltage of 150 kV, the elemental constituent
of as-prepared catalyst was determined by an X-ray fluorescence
spectrometer