To describe materials from a macroscopic point of view, there are two main approaches. The first approach describes the conductivity or the resistivity of the materials, which requires the knowledge of the microstructure. If the material cannot be assumed to be an isotropic bulk material, the observed behavior has to be described with anisotropic material models. However, the microstructure is often not well known. Therefore, characteristic material layers were measured to provide characteristic material parameters such as the temperature coefficients for the conductivities or the sheet resistance, which is mainly determined by the fabrication process. This provides an important advantage for the design in terms of computational effort for the evaluations of the models.