Most systems switched by thyristor will therefore require pulse compression or
pulse sharpening elements. Semiconductors optimised for general power electronic
application may well also have internal features different to what would be ideal for
pulsed applications. The approach taken by Kardo–Sysoev and Grekhov has been to
revisit generic device types including the pn diode, thyristor, and bipolar transistor and
reengineer both device topologies and the junction design specifically to enhance high
speed capabilities. Most work has been carried out using silicon as the semiconductor
material. The four device types that have arisen are the reverse switching dynistor
(RSD), field ionisation dynistor (FID), drift step recovery diode (DSRD) and the
delayed breakdown diode (DBD). The RSD and FID devices are essentially variants
of the thyristor structure, but with switching times of the order of 0.5–5 ns [44]. The
RSD is a two-terminal device and is switched by a reverse pumping current followed
by a relatively rapidly applied forward voltage. The FID is a three-terminal device
and is more conventionally triggered by a gate pulse of the order of 50–100 V. Both
FID and RSD device types are inherently thyristor-like, large die area devices, and
can be designed to carry up to several kA and kV.
Most systems switched by thyristor will therefore require pulse compression orpulse sharpening elements. Semiconductors optimised for general power electronicapplication may well also have internal features different to what would be ideal forpulsed applications. The approach taken by Kardo–Sysoev and Grekhov has been torevisit generic device types including the pn diode, thyristor, and bipolar transistor andreengineer both device topologies and the junction design specifically to enhance highspeed capabilities. Most work has been carried out using silicon as the semiconductormaterial. The four device types that have arisen are the reverse switching dynistor(RSD), field ionisation dynistor (FID), drift step recovery diode (DSRD) and thedelayed breakdown diode (DBD). The RSD and FID devices are essentially variantsof the thyristor structure, but with switching times of the order of 0.5–5 ns [44]. TheRSD is a two-terminal device and is switched by a reverse pumping current followedby a relatively rapidly applied forward voltage. The FID is a three-terminal deviceand is more conventionally triggered by a gate pulse of the order of 50–100 V. BothFID and RSD device types are inherently thyristor-like, large die area devices, andcan be designed to carry up to several kA and kV.
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