The failure detection based testers are based upon
sensing the voltage, current, voltage collapse (dv/dt) or
current rise (di/dt). This allows the stored energy to be
diverted to protect the DUT. The majority of this type of
tester reported in the literature is based upon detecting the
collapse of the DUT voltage following DUT failure [1, 3,
4]. The iterative based testers rely on repeated testing
under identical conditions whilst gradually increasing the
delay time before activating the protective action until
either the failure occurs or the DUT passes. [5, 6].
The tester under consideration in this wor