Surface morphology
Film samples were examined for surface
characteristics using a JEOL JSM-6400 scanning
electron microscope (JOEL Ltd., Tokyo, Japan)
operated at 15 kV. Five samples were mounted on a
bronze stub and sputter-coated (Sputter Coater Baltec
SCD 005, Liechtenstein) with a layer of gold
prior to imaging in order to increase their electrical
conductivity. Images were registered at 500 x
magnification.