The morphology of n-HA and n-HA coated implant material (Ti6Al4V) was studied using scanning electron microscope (SEM), JEOL 2, Model — JSM6610LV, coupled with Energy Dispersive X-ray Spectroscopy (EDS) (Oxford, model-Incax-act, 51-ADD0013)
The morphology ofn-HA and n-HA coated implant material (Ti6Al4V) was studied usingscanning electron microscope (SEM), JEOL 2, Model — JSM6610LV,coupled with Energy Dispersive X-ray Spectroscopy (EDS) (Oxford,model-Incax-act, 51-ADD0013)