Diamond surfaces were analyzed by high resolution X-ray photoelectron
spectroscopy (XPS). As X-ray source, a monochromatized Al
Kα anode (1486.6 eV) was used calibrated versus the Au 4f7/2 peak located
at 84.0 eV. The spectrometer was equipped with an EA 125 hemispherical
analyzer. The pass energy was 20 eV, corresponding to an
energy absolute resolution of 0.6 eV. Measurements were done at 51°
detection angle. The XPS data of the C1s spectral region were corrected
thanks to a Shirley-background subtraction. To obtain the peak positions
and relative contributions of chemically shifted components, a
fitting procedure was applied using Voigt functions. Raman analyses
were carried out with a LAbRAM HR Jobin Yvon. A 514 nm excitation
wavelength associated to a confocal aperture of 100 μmand 120 s of acquisition
time were used.