When higher current rated power modules are required, there are two ways of enabling this. The
first method is to increase the chip size of the transistors and diodes thereby increasing the forward
current conduction capability. This is more easily done for silicon technologies where the fabrication
process is mature and yields are high, however, this is not easily done in SiC technology where chip
sizes are still relatively small. The second method of increasing the current conduction capability is
simply increasing the number of parallel connected devices [1, 2]. A very important consideration for
this technique is ensuring that there is electrothermal stability between the parallel connected devices
[3, 4]. If the on-state resistance of the device increases with the junction temperature, then current flow