ABSTRACT
In this paper, a novel full range window comparator
with self-testability feature is presented. The use of a
mixed-signal full range window comparator for
Built-In-Self-Test (BIST) of analogue cores in
System-On-Chip (SOC) was described in [1-2].
Therefore we leverage on the design effort already
spent in providing an effective means of testing SOCs,
by making the comparator self-testable hence the
potential problem of a faulty comparator circuit
during test mode operation is greatly reduced.