1 EL inspection: Power Loss Prediction
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inspection settings > Prediction: PL & MLP
Overview: In this section two different power loss predictions schemes are done.
1.The general power loss prediction (PL) takes all cell defects into account.
2.The mono line prediction (MLP), is used to generate power loss data from micro crack lines on
mono crystalline cells.
Figure 1: PL & MLP: Parameter overview
General usage:
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