5.3 Contour line construction method
We summarize the contour line construction procedure as follows:
Consider starting at a feasible point X ∈ F which has an objective function value of z.
171. Draw the EF traversal lines and form the grid.
2. Identify the cell C which contains X.
3. Identify the subcells in cell C.
(a) Identify ETTLs formed due to EF I/O points, for flow between EF I/O points and X in
cell C and determine its subcells. Note that the NF is finite-sized and could cause the
ETTL to move from the point NF case (Result 3).
(b) Identify the interference sets Qs, where the NF interferes with any of the material flows.
Identify the ETTLs formed, due to the NF for material flow between a pair of EF I/O
points or an EF I/O point and X, inside cell C and hence determine the subcells.
4. For cell C and its subcells, assign weights of the unaffected EF I/O point to X material flow
to the appropriate cell corner. For affected material flow between a pair of EF I/O points and
between an EF I/O point and X, assign weights to the corners as described in Section 5.2.2.
5. For cell C and its subcells, the slope of the contour line is determined as follows:
5.3 Contour line construction methodWe summarize the contour line construction procedure as follows:Consider starting at a feasible point X ∈ F which has an objective function value of z.171. Draw the EF traversal lines and form the grid.2. Identify the cell C which contains X.3. Identify the subcells in cell C.(a) Identify ETTLs formed due to EF I/O points, for flow between EF I/O points and X incell C and determine its subcells. Note that the NF is finite-sized and could cause theETTL to move from the point NF case (Result 3).(b) Identify the interference sets Qs, where the NF interferes with any of the material flows.Identify the ETTLs formed, due to the NF for material flow between a pair of EF I/Opoints or an EF I/O point and X, inside cell C and hence determine the subcells.4. For cell C and its subcells, assign weights of the unaffected EF I/O point to X material flowto the appropriate cell corner. For affected material flow between a pair of EF I/O points andbetween an EF I/O point and X, assign weights to the corners as described in Section 5.2.2.5. For cell C and its subcells, the slope of the contour line is determined as follows:
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