X-ray diffraction spectra of the TGO films formed by thermal
oxidation at different temperatures between 450 and 850 8C are
presented in Fig. 1. It is found that all the TGO films maintain
rutile structure of SnO2. As the oxidation temperature increases,
diffraction peak intensity enhances, originating the improved
crystalline quality obtained. It is noticed that the relative intensity
of (113) diffraction is apparently higher than that of the standard