XANES measurements were performed on beamline 27SU at
SPring-8 (Hyogo, Japan). The samples and reference materials were
set on an aluminum holder using conductive double-stick tape.
Spectra were recorded in fluorescence mode with a double-crystal
Si(1 1 1) monochromator and silicon drift detector under vacuum
conditions. The data obtained were analyzed with an REX2000
(Rigaku Co., Ltd., Tokyo, Japan)