Abstract
An analytical approach to electro thermal simulation of
SOI integrated circuits is presented, accounting for large
temperature gradients in the devices. Electro thermal
simulations of SOI analog circuits in Spice coupled with
the non iso thermal approach are performed and compared
with the iso thermal BSIMSOI thermal circuit. Heat flow,
thermal coupling and self-heating effects in some SOI
analog integrated circuits are examined. Non iso thermal
effects on some electrical properties of analog circuits
are also briefly discussed.