After the correct conditioning, the signal is ready to be
digitized. Force measurement demands low rate, low
noise and high resolution quantification. For most
applications of non-dynamic measurements, the
sampling time is at long intervals. To diminish noise,
averages of four or more acquisitions are performed
before data are used. This can be done by multi-slope or
sigma-delta ADCs. Resolutions greater than 16 bits and
sample rates from 10-1000 S/s are quite adequate. In this
work, we used a 1 kS/s sigma-delta ADC and 100 Hz low
pass filtering (RC and sample averaging). Today, there
are many ADCs that meet these requirements. There are
also Systems-on-a-chip (SoC) available that includes a
microcontroller, high resolution AD, programmable gain
amplifiers, filtering and communication peripherals.