The surface morphology of both the upper (drying surface) andlower (in contact with Petri dish) sides of films was observedaccording to Pagno et al. (2015), with some modifications. A scan-ning electron microscope (SEM) (JEOL, JSM 6060, Japan) was used.Samples were fixed on aluminum stubs, coated with gold andscanned with an accelerating voltage of 5.0 kV and a magnificationof 1000×.