X-ray diffraction patterns of the ZnO nanorods grown on the
ZnO–PVA seed layers (on silicon substrates) annealed at different
temperatures, ranging from 250 ◦C to 550 ◦C and are shown in Fig. 5.
The X-ray diffraction patterns match the wurtzite hexagonal phase
of ZnO. All the peaks correspond to the ZnO phase, except for the
two peaks at 44.5◦ and 64.4◦,which are related to the silicon carbide
of theXRDsample holder. Fig. 5(a and b) shows the X-ray diffraction
patterns of the ZnO nanorods grown on seeded substrates annealed
at 250 ◦C and 350 ◦C, respectively. These patterns reveal that the
ZnO nanorods were randomly oriented on the substrates, as seen
in the FESEM images (Fig. 6(a and b)). Fig. 5c for sample C exhibits