Good qualityADP–KDPmixedcrystal(90:10)isgrownbyslowcoolingmethod.Thesizeofthegrown
crystalis801010 mm3. Themountedseedsizewas51010 mm3 and thecrystalwasgrown
along the‘c’ axis.HRXRDstudieshavebeendoneinthenearandfarregionsoftheseedcrystal.
The FWHMofthesediffractioncurvesare28and29arcsec,whicharealmostthesame.Theclosevalues
of FWHMofboththespecimensindicatethatthequalityofthecrystalremainsnearlythesame
throughoutthecrystal.80%oftransparencyisobservedfromtheUV–visstudiesintheentirevisible
region. Vickershardnessstudiesindicatethatthemixedcrystalismechanicallymorestablecompared
to theADP.Higherpiezoelectriccoefficientisobservedinmixedcrystals.Dielectricmeasurementsare
carriedout.Fromthelaserdamagethresholdstudies,itisobservedthathigherenergyisrequiredto
damage themixedcrystalanditindicatesthatthelaserstabilityofthemixedcrystalishigh.