using energy compensating lters. These lters, which are usually some form of
metal [5], allow the incident radiation to be indirectly" detected. Eectively,
the photon interactions within the lter emit secondary electrons which can be
detected in the silicon semiconductor. This method gives a practical way of
measuring photon pulses over a large range of energies, but at the expense of the
energy information of the incident photons themselves.
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