3.4. FTIR analysis
A Perkin–Elmer system 2000 FTIR Spectrometer was used with
an attenuated total reflectance (ATR) accessory to gather the IR
spectra of the reported specimens.
3.5. Morphological studies
Morphological studies were conducted using a JEOL scanning
electron microscope (model JSM-6400). Specimens were sputtercoated
with gold to a thickness of 10 nm in order to prevent
charging during the examination. The SEM used was equipped
with a lanthanum hexaboride (LaB6) crystal as a source of electrons.
An accelerating voltage of 13 kV was used to collect the
SEM images.