The Ion Beam Analysis (IBA) techniques are a powerful tool to investigate in a fully non-invasive way the composition of a material. To this purpose, the object to be analysed is used as a target for a beam of accelerated particles. The interactions of the beam particles with the atoms (or the nuclei) of the target material induce from the latter the emission of secondary radiation (X-rays, gamma rays, particles), having an energy characteristic of the emitting atom or nucleus. Suitable nuclear detectors are then used to collect and discriminate in energy the emitted radiation and make it therefore possible � in a single measurement - to detect and quantify the presence of the different elements in the analysed material.