Fig. 3 A) High-resolution transmission electron microscopy (HRTEM)
image of top face of Cu2S hexagonal nanoprisms. B) Top trace shows
X-ray diffraction pattern obtained from nanoprisms cast onto silicon
substrates showing pure monoclinic phase Cu2S (low-chalcocite).
Droplines (shown below) correspond to data from published diffraction
pattern JCPDS 01-083-1462. C) UV-vis absorbance is shown as a plot of
(a*E)1/2 versus E, where a is the sample absorbance and E is the incident
wavelength energy.