Our results are summarized in Figure 2a−c. As previously
mentioned, the potential difference decreased to 0 V in 15 s for
the Pt anode cells, independent of the current density and the
temperature. Thus, the charge density q = tj increased
proportionally to the current density j. Accordingly, the data
for the Pt cells in Figure 2b could be fit with q = (14 s)j. For the
VOx/Pt anode cells, the charge density followed a linear
relationship q = q0 + τj with q0 = 28 and 24 mC cm−2 and τ =
58 and 32 s for the 27 and 17 nm thick VOx/Pt anode
respectively. The charge available thus increases with the
vanadium oxide film thickness. The average ratio of charge
densities for the 27 and 17 nm thick VOx anode at identical
temperatures and current densities is equal to 1.5 ± 0.2, which
matches with the thickness ratio ∼1.6. The progressive
transition from a relatively constant charge density regime to
a constant time regime with increasing current density indicates
that at least two charge storage processes may occur in parallel,
one of them being deactivated at a constant rate.
Our results are summarized in Figure 2a−c. As previously
mentioned, the potential difference decreased to 0 V in 15 s for
the Pt anode cells, independent of the current density and the
temperature. Thus, the charge density q = tj increased
proportionally to the current density j. Accordingly, the data
for the Pt cells in Figure 2b could be fit with q = (14 s)j. For the
VOx/Pt anode cells, the charge density followed a linear
relationship q = q0 + τj with q0 = 28 and 24 mC cm−2 and τ =
58 and 32 s for the 27 and 17 nm thick VOx/Pt anode
respectively. The charge available thus increases with the
vanadium oxide film thickness. The average ratio of charge
densities for the 27 and 17 nm thick VOx anode at identical
temperatures and current densities is equal to 1.5 ± 0.2, which
matches with the thickness ratio ∼1.6. The progressive
transition from a relatively constant charge density regime to
a constant time regime with increasing current density indicates
that at least two charge storage processes may occur in parallel,
one of them being deactivated at a constant rate.
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