Greater understanding of TE materials requires various transport measurement techniques.
As part of this research a new measurement system has been developed to measure thermopower
(or absolute Seebeck coefficient) in an open air, room temperature environment. This system
allows for scanning probe capabilities for greater characterization abilities. The thermopower of
a semiconductor is related to the concentration of impurities, using this information an indication
of the degree of homogeneity of a sample can be obtained by measuring the thermopower from
point to point on the surface of a sample. Inhomogeneous TE devices have been known to
increase the efficiency of these devices and this concept will be discussed in further detail in later
chapters. This system can also help gain insight into doping effects near metal contacts.