Manually, it is a tough task to identify all the peaks in XRD pattern of a complex material like soil. The software compares each diffraction pattern in the reference pattern data-base, ICDD PDF-2, to the pattern of unknown sample. It calculates a numerical value indicating the degree of agreement, the so called figure-of-merit (FoM) and the entries with the high value of FoM are the ones that are more likely to be present in the sample.