High resolution
scanning electron microscope (HR-SEM, Hitachi S-4300 SE/N
SCM)) equipped with energy dispersive spectroscopy (EDAX) on the
fracture surface of the TiO2 film. The chemical nature in the surface
of the film was analyzed using X-ray photoelectron spectroscopy
(XPS) OMICRON instrument equipped with aluminum anodes using
Al K radiation. The peak positions used were based on the calibration
with respect to the C 1s peak at 284.6 eV. Optical transmittance
studies were carried out using a double beam spectrophotometer.
Adhesion and hardness testing was done as per ASTM D 3359-08
and 3363-05 respectively.