Figure 3 shows the XRD patterns of PLA/PU and
PLA/PU/GO (5%) films as well as the XRD pattern of
powdery GO.The XRDpattern of the GOpowders exhibits a
characteristic diffraction peak at 11.6
∘
(the shoulder centered
at 20
∘
is attributed to the glass plate, which is used as the sub-strate of supporting powdery sample for XRDmeasurement).
The XRD patterns obtained from the PLA/PU/GO (5%) film
is similar to thoseof thePLA/PUfilmapart fromthe existence
of a weak peak ascribed to the GOphase.Therefore, the XRD
result further confirms the successful addition of GO sheets
into PLA/PUfilm, which is consistent with the result coming
from SEM investigations. The weakening of GO peak is due
to two aspects: one is the relatively low content of GO and
the other is the good dispersion of GO within the PLA/PU
matrix