2.3. Characterization
The layer number of the rGO was characterized by MultimodeNanoscope
IV (Veeco, Santa Barbara, CA) Atomic Force Microscope
(AFM), equipped with an E scanner and NSC11/AIBS cantilevers
(MikroMasch, Tallinn, Estonia), and all images were obtained using
tapping mode with the scan rate of 1.0 Hz as well as the cantilever
with a spring constant of 40 N m1
.