The proposed spectral evaluation model used in element quantification
can improve the instrumental sensitivity for measurement of
these elements, which is limited when determining trace levels in
conventionalWDXRF systems. Suitable limits of detection (from 0.005
to 0.1 mg L−1) were attained, according to the present regulatory
requirements established by the TCLP 1311 (US-EPA) and DIN 38414-
S4 (German Standard Method) procedures. In addition, comparison
between the values obtained using the semiquantitative procedure
developed and those from ICP techniques shows acceptable agreement
in terms of accuracy for elements with ZN20.