Characterization of the composite
2.8.1. X-ray diffraction
X-ray diffraction (XRD) patterns were revealed with a Pan Analytical
Model X’Pert Pro which had CuK, ( = 0.1542 nm) Bruker
AXS Germany. The diffractograms were recorded in the 2 range of
20–50◦ with step size of 0.02A˚ and a step time of 0.605.