of growth temperature, when the growth temperature is higher
than the Mg melting point of 649 C.
XRD measurements have been performed on the structures of
the obtained Zn1xMgxO nanomaterials. It could be observed from
Fig. 4(a) that six prominent XRD peaks correspond to (100), (002),
(101), (102), (110), and (103) crystal planes of hexagonal ZnO
according to the standards of the Joint Committee on Powder Diffraction
Standards. No diffraction peaks from metallic Mg, MgO or
other impurity phases suggest that Mg2+ is substituted at the Zn2+
sites and the samples are in the single phase. Moreover, it is noted
that with the increase of Mg content, the (002) peaks have slightly
shifted to higher diffraction angle, as shown in Fig. 4(b), indicating
of growth temperature, when the growth temperature is higher
than the Mg melting point of 649 C.
XRD measurements have been performed on the structures of
the obtained Zn1xMgxO nanomaterials. It could be observed from
Fig. 4(a) that six prominent XRD peaks correspond to (100), (002),
(101), (102), (110), and (103) crystal planes of hexagonal ZnO
according to the standards of the Joint Committee on Powder Diffraction
Standards. No diffraction peaks from metallic Mg, MgO or
other impurity phases suggest that Mg2+ is substituted at the Zn2+
sites and the samples are in the single phase. Moreover, it is noted
that with the increase of Mg content, the (002) peaks have slightly
shifted to higher diffraction angle, as shown in Fig. 4(b), indicating
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