This paper describes a PaaS platform of Cloud-EDA for IC
design and test, the rest of the paper is organized as follows.
Section II describes the architecture and the hierarchical
structure of this platform. Section III shows the development
process of a test-pattern-conversion app based on the prototype
of this platform and displays the workflow of chip test process.
The results and analysis of this platform are presented in
Section IV. And the Section V concludes this paper.