PW/1710 with Ni-filtered Cu-Kα radiation (λ = 1.542 Å) powered at 40 kV and 30 mA was used. The XRD patterns as shown in Fig. 1 revealed the characteristic broad humps of the vitreous materials and did not reveal discrete or any sharp peaks
PW/1710 with Ni-filtered Cu-Kα radiation (λ = 1.542 Å)powered at 40 kV and 30 mA was used. The XRD patterns as shown inFig. 1 revealed the characteristic broad humps of the vitreous materialsand did not reveal discrete or any sharp peaks