extracted factors.
This analysis yielded four factors with eigenvalues greater than 1 .O. A four-
factor solution was supported by the Scree Plot. The four factors account for a
total of 69.8% of the variance in test scores. The first rotated factor, accounting
for 25.4% of the variance, has high loadings for the five memory span tests and
also the five performance subtests and the Arithmetic subtest of the WPPSI-R.
This first factor therefore appears to be a memory span/performance ability fac-
tor. The second factor accounts for 23.2% of the variance and correlates most
strongly with the eight RT tests. All RT tests load highly on this second factor
and it is therefore interpreted as a speed of processing factor. The third factor can
be interpreted as a verbal ability factor, accounting from 14.7% of the variance
and loading the five verbal tests of the WPPSI-R. The fourth factor, accounting
for 6.5% of the variance, loads primarily the memory span tests, suggesting that
this final factor is a pure memory span factor.
The first unrotated factor in the analysis of all three test batteries reveals a
lear general factor. All eight RT tests have substantial negative loadings on the
irst unrotated factor, whereas all five memory tests and all 10 WPPSI-R sub-
ests have substantial positive loadings. This analysis demonstrates the existence
of factors representing speed of information processing, memory span, verbal
ability, and performance ability. In addition, this analysis provides strong support
or the existence of a general factor common to all three test batteries. Factor
oadings for all RT tests, memory span tests and WPPSI-R raw subtests on the
our rotated factors, as well as on the first unrotated factor, are presented in Table
15.
Confirmatory Hierarchical Factor Model of All Three Batteries
n order to further investigate the factor structure of the three batteries and their
extracted factors.
This analysis yielded four factors with eigenvalues greater than 1 .O. A four-
factor solution was supported by the Scree Plot. The four factors account for a
total of 69.8% of the variance in test scores. The first rotated factor, accounting
for 25.4% of the variance, has high loadings for the five memory span tests and
also the five performance subtests and the Arithmetic subtest of the WPPSI-R.
This first factor therefore appears to be a memory span/performance ability fac-
tor. The second factor accounts for 23.2% of the variance and correlates most
strongly with the eight RT tests. All RT tests load highly on this second factor
and it is therefore interpreted as a speed of processing factor. The third factor can
be interpreted as a verbal ability factor, accounting from 14.7% of the variance
and loading the five verbal tests of the WPPSI-R. The fourth factor, accounting
for 6.5% of the variance, loads primarily the memory span tests, suggesting that
this final factor is a pure memory span factor.
The first unrotated factor in the analysis of all three test batteries reveals a
lear general factor. All eight RT tests have substantial negative loadings on the
irst unrotated factor, whereas all five memory tests and all 10 WPPSI-R sub-
ests have substantial positive loadings. This analysis demonstrates the existence
of factors representing speed of information processing, memory span, verbal
ability, and performance ability. In addition, this analysis provides strong support
or the existence of a general factor common to all three test batteries. Factor
oadings for all RT tests, memory span tests and WPPSI-R raw subtests on the
our rotated factors, as well as on the first unrotated factor, are presented in Table
15.
Confirmatory Hierarchical Factor Model of All Three Batteries
n order to further investigate the factor structure of the three batteries and their
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