The WPI-based film thickness values
were lower than those reported by Vachon, Yu, Yefsa,
Alain St-Gelais, and Lacriox (2000) with thicknesses of
0.05 to 0.06 ± 0.002 mm for the same material but crosslinked
by heating and irradiation. However, the values
were much higher than those reported by Simelane and
Ustunol (2005) who noted a thickness value of
0.14 ± 0.02 mm. This was due to differences in film-forming
solution formulations and procedures used.