ray diffraction (XRD) patterns of the samples were obtained using a PAN alytical X pert Promodel diffractometer equipped with a monochromatic Cu-Kα (1.541874Å
ray diffraction (XRD) patterns of the samples were obtained using a PAN alytical X pert Promodeldiffractometer equipped with a monochromatic Cu-Kα (1.541874Å