However void
at the interface between die and substrate is one of major
concerns.
However void
at the interface between die and substrate is one of major
concerns. There are many factors contributed to void
performance including DAF material property, substrate
surface condition, die attach parameters and so on. In this
paper, the effect of transfer pressure on void performance in a
ball grid array plastic package is focused on. Simultaneously
the characteristic of DAF void and its formation/reduction
mechanism also are investigated. It was found that the DAF
voids occur at substrate/film interface with fixed location and
similar pattern. They can be reduced significantly by
enhancement of transfer pressure during molding process,
which can be explained that gap on substrate surface is filled
furthest by film under high transfer pressure.