For simple (e.g. binary or ternary) mixtures of crystal phases, the phase-specific sinograms Sc(x, ω) may be simply obtained
by calculating the total diffracted intensity inside a number of specific 2θ ranges, corresponding to the position of phase-specific diffraction peaks. Since the intensity of each (nonoverlapped) Bragg peak is proportional to the amount of the corresponding scattering material,[6–9] the inverse Radon transform of these sinograms will show the distribution of that phase.