3.8. The time to failure in hours of an electronic compo- nent subjected to an accelerated life test is shown in Table 3E. I. To accelerate the failure test, the units were tested at an elevated temperature (read down, then across). (a) Calculate the sample average and standard deviation. (b) Construct a histogram. (c) Construct a stem-and-leaf plot. (d) Find the sample median and the lower and upper quartiles. 3.9. The data shown in Table 3E.2 are chemical process yield readings on successive days (read down. then across). Construct a histogram for these data